Semiconductor Materials Diagnostics Core Facility
Priority areas of activity: physics of semiconductor materials and structures; surface physics, optoelectronics and photonics; THz and IR functional semiconductor micro- and nanophotoelectronics; physics and technology of sensor systems; semiconductor lighting engineering; ground and space photoelectric devices. Structural divisions: Scanning probe microscopy complex; Laboratory of Raman luminescence and infrared Fourier spectroscopy; Laboratory of high-resolution X-ray diffractometry; Complex of mass spectrometry and X-ray photoelectron spectroscopy; Laboratory of spectral ellipsometry; Measuring complex for express control of semiconductor materials and nanoscale devices; Center for testing and diagnostics of semiconductor light sources and lighting systems; Photovoltaic converter and photovoltaic battery testing center.
Hosting partner: Lashkaryov Institute of Semiconductor Physics
Facility type: Core facility
Current status: Pilot / preparation node
Typical users
Institutions of the NAS Ukraine, institutions of higher education, enterprises and other teams of scientific, technical and innovative activities for cooperation.
Related resources
Equipment for electrical characterization of semiconductor materials, structures and nanoscale devices
The measuring complex is designed for rapid electrical and electrophysical characterization of semiconductor materials, structures and nanoscale devices. It supports DC and AC electrical measurements, including current-voltage characteristics, …
Services using this facility
Semiconductor materials, structures and device diagnostics
Semiconductor materials, structures and device diagnostics is an integrated experimental service for the characterization of semiconductor materials, thin films, nanostructures, multilayer structures and semiconductor-based devices. The service combines …